カールツァイス株式会社(本社:東京都千代田区、代表取締役社長:ヴィンセント・マチュー)、オックスフォード・インストゥルメンツ株式会社(本社:東京都品川区、代表取締役社長:合田 豊治)およびJFEテクノリサーチ株式会社(本社:東京都千代田 ...
Scanning electron microscopy (SEM) has been an important tool for forensic science since the 1970s, and it continues to find forensic applications today. The technique – capable of 100,000x ...
X-rays, a type of electromagnetic radiation with wavelengths from 0.01 to 10 nanometers, pack enough energy to pierce materials and interact with inner-shell electrons. 1 When they hit a sample, ...
As part of our continuous investment in high-quality teaching facilities, the School of Physics has installed a new TESCAN VEGA3 XMU high resolution Scanning Electron Microscope (SEM) equipped with ...